Lutz was a student at the University of Kansas, graduating in 1976 and earning master's degrees in mathematics and in computer science there in 1979 and 1981 respectively.[3] He went to the California Institute of Technology for doctoral study in mathematics, and completed his Ph.D. in 1987, with the dissertation Resource-Bounded Category and Measure in Exponential Complexity Classes supervised by Alexander S. Kechris.[3][4]
He has spent the rest of his career at Iowa State University, as an assistant professor from 1987 to 1992, associate professor from 1992 to 1996, and full professor since 1996.[3] At Iowa State, he directs the Laboratory for Molecular Programming.[5]
Personal life
Lutz is married to Robyn Lutz, a professor of computer science at Iowa State University; their son Neil Lutz[6] is also a computer scientist and a visiting assistant professor of computer science at Swarthmore College.[7] They have published together on algorithmic game theory in DNA computing.[8]
References
↑ Ambos-Spies, Klaus; Mayordomo, Elvira (May 2019). "Resource-bounded measure and randomness". In Sorbi, Andrea (ed.). Complexity, Logic, and Recursion Theory. CRC Press. pp.1–47. doi:10.1201/9780429187490-1. ISBN978-0-429-18749-0. S2CID15041656. In this survey we present the fundamental results of Lutz's resource-bounded measure theory
↑ Reimann, Jan; Stephan, Frank (2005). "Effective Hausdorff dimension". In Baaz, Matthias; Friedman, Sy-David; Krajíček, Jan (eds.). Logic Colloquium '01: Proceedings of the Annual European Summer Meeting of the Association for Symbolic Logic, held in Vienna, Austria, August 6–11, 2001. Lecture Notes in Logic. Vol.20. Association for Symbolic Logic. pp.369–385. MR2143904. We continue the study of effective Hausdorff dimension as it was initiated by Lutz
↑ Lutz, Jack H.; Lutz, Neil; Lutz, Robyn R.; Riley, Matthew R. (May 2019). "Robustness and games against nature in molecular programming". 2019 IEEE/ACM 41st International Conference on Software Engineering: New Ideas and Emerging Results (ICSE-NIER). IEEE. pp.65–68. arXiv:1902.06171. doi:10.1109/icse-nier.2019.00025. ISBN978-1-7281-1758-4.
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